Surface inspection and defect recognition
In many areas, ever-increasing requirements are placed on the quality and the appearance of a surface. Particularly with reflecting surfaces, faultless production is expected.
reflectCONTROL Compact is designed specifically for the inspection of shiny surfaces. The system projects a striped pattern onto the measurement object. Defects on the surface cause deviations from the striped pattern, which are recorded by cameras and evaluated by software. The fully integrated system is available in two versions that each provides different measuring fields. The 2D version is used for pure defect recognition on reflecting surfaces.
The 3D version allows for an additional measurement of reflecting surfaces at sub-micrometer accuracies. This device is also used in individual operations (e.g. laboratories) as well as directly in production lines.
In many areas, ever-increasing requirements are placed on the quality and the appearance of a surface. Particularly with reflecting surfaces, faultless production is expected.
reflectCONTROL Compact is designed specifically for the inspection of shiny surfaces. The system projects a striped pattern onto the measurement object. Defects on the surface cause deviations from the striped pattern, which are recorded by cameras and evaluated by software. The fully integrated system is available in two versions that each provides different measuring fields. The 2D version is used for pure defect recognition on reflecting surfaces.
The 3D version allows for an additional measurement of reflecting surfaces at sub-micrometer accuracies. This device is also used in individual operations (e.g. laboratories) as well as directly in production lines.
| Items |
 RCC100-140 2 Dimensional (2D) Version 80 to 100 Micrometer (µm) Lateral Resolution reflectCONTROL Compact Inspection Equipment for Reflecting Surfaces |
RCC100-105 2 Dimensional (2D) Version 65 to 75 Micrometer (µm) Lateral Resolution reflectCONTROL Compact Inspection Equipment for Reflecting Surfaces |
RCC110-265 2 Dimensional (2D) Large Measuring Field Version 80 to 100 Micrometer (µm) Lateral Resolution reflectCONTROL Compact Inspection Equipment for Reflecting Surfaces |
RCC110-210 2 Dimensional (2D) Large Measuring Field Version 65 to 75 Micrometer (µm) Lateral Resolution reflectCONTROL Compact Inspection Equipment for Reflecting Surfaces |
RCC130-135 3 Dimensional (3D) Version 80 to 100 Micrometer (µm) Lateral Resolution reflectCONTROL Compact Inspection Equipment for Reflecting Surfaces |
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| Version | 2D | 2D | 2D - Large Measuring Field | 2D - Large Measuring Field | 3D | |||||
| Lateral Resolution | 80 to 100 µm | 65 to 75 µm | 80 to 100 µm | 65 to 75 µm | 80 to 100 µm | |||||
| Approximate Measuring Field Length | 140 mm | 105 mm | 265 mm | 210 mm | 135 mm | |||||
| Approximate Measuring Field Width | 118 mm | 88 mm | 110 mm | 86 mm | 115 mm | |||||
| Resolution Height | 10 nm | |||||||||
| Zero Position of the Measurement Object Under the Housing Bottom Edge | 30 mm | |||||||||
| Weight | < 20 kg | |||||||||
| Direct Current (DC) Supply Voltage | 100 to 230 V | |||||||||
| Frequency | 50 Hz60 Hz | |||||||||
| Interfaces | Digital I/O Ethernet USB VGA | |||||||||
| Operating Temperature | +5 to +40 ºC | |||||||||
| Storage Temperature | -10 to +60 ºC | |||||||||
| Temperature Fluctuations During Operation without Calibration (±) | 2.5 ºC | |||||||||
| Relative Air Humidity in Declared Temperature without Condensation | 10 to 80 % | |||||||||
| Outermost Length | 452 mm | |||||||||
| Outermost Width | 452 mm | |||||||||
| Innermost Length | 416 mm | |||||||||
| Innermost Width | 416 mm | |||||||||
| Features |
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| All-in-One |
All components are integrated in a compact device. The housing includes a monitor for the striped pattern protection, as well as two cameras. In order to avoid interferences from ambient light, the measuring field can be darkened on all four sides. The legs are height-adjustable which enables to balance different component heights. This operation is performed via touch screen or mouse and keyboard, which can be connected via USB. reflectCONTROL Compact can be integrated into production lines. A digital I/O interface enables triggering and alarms. If the device is installed in a difficult-to-access place, an external operating monitor can be connected via VGA. The pre-installed operating and evaluation software of the 2D version shows surface defects. The 3D version provides a point cloud. The data obtained can be treated in the image processing programs. |
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| Free Test Measurement | In order to objectively appraise your measurement task, Micro-Epsilon offers non-binding inspections of your boundary samples. | |||||||||
| Application Examples |
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