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Surface inspection and defect recognition
In many areas, ever-increasing requirements are placed on the quality and the appearance of a surface. Particularly with reflecting surfaces, faultless production is expected.
reflectCONTROL Compact is designed specifically for the inspection of shiny surfaces. The system projects a striped pattern onto the measurement object. Defects on the surface cause deviations from the striped pattern, which are recorded by cameras and evaluated by software. The fully integrated system is available in two versions that each provides different measuring fields. The 2D version is used for pure defect recognition on reflecting surfaces.
The 3D version allows for an additional measurement of reflecting surfaces at sub-micrometer accuracies. This device is also used in individual operations (e.g. laboratories) as well as directly in production lines.
reflectCONTROL Compact Inspection Equipment for Reflecting Surfaces
reflectCONTROL Compact Inspection Equipment for Reflecting Surfaces - 2
Unit of Measure
1 

Item #

Item Name

Version

Lateral Resolution

Approximate Measuring Field Length

Approximate Measuring Field Width

RCC100-140 N/A 2 Dimensional (2D) Version 80 to 100 Micrometer (µm) Lateral Resolution reflectCONTROL Compact Inspection Equipment for Reflecting Surfaces N/A 2D N/A 80 to 100 µm N/A 140 mm N/A 118 mm
RCC100-105 N/A 2 Dimensional (2D) Version 65 to 75 Micrometer (µm) Lateral Resolution reflectCONTROL Compact Inspection Equipment for Reflecting Surfaces N/A 2D N/A 65 to 75 µm N/A 105 mm N/A 88 mm
RCC110-265 N/A 2 Dimensional (2D) Large Measuring Field Version 80 to 100 Micrometer (µm) Lateral Resolution reflectCONTROL Compact Inspection Equipment for Reflecting Surfaces N/A 2D - Large Measuring Field N/A 80 to 100 µm N/A 265 mm N/A 110 mm
RCC110-210 N/A 2 Dimensional (2D) Large Measuring Field Version 65 to 75 Micrometer (µm) Lateral Resolution reflectCONTROL Compact Inspection Equipment for Reflecting Surfaces N/A 2D - Large Measuring Field N/A 65 to 75 µm N/A 210 mm N/A 86 mm
RCC130-135 N/A 3 Dimensional (3D) Version 80 to 100 Micrometer (µm) Lateral Resolution reflectCONTROL Compact Inspection Equipment for Reflecting Surfaces N/A 3D N/A 80 to 100 µm N/A 135 mm N/A 115 mm
RCC130-105 N/A 3 Dimensional (3D) Version 65 to 75 Micrometer (µm) Lateral Resolution reflectCONTROL Compact Inspection Equipment for Reflecting Surfaces N/A 3D N/A 65 to 75 µm N/A 105 mm N/A 87 mm
Unit of Measure
1